Reliability for the Power Electronics of Tomorrow
Chemnitz Power Labs GmbH develops state-of-the-art test systems for assessing the reliability of power electronic components.
Products
CPL Advanced Reliability Tester (ART)
With the ART, we offer a powerful and flexible platform for performing demanding reliability tests such as Power Cycling (PC), Dynamic Gate Stress Testing (DGS), and Bipolar Degradation / Pulsed High-Temperature Forward Bias Testing (pHTFB).
The platform is ready for use with wide-bandgap semiconductors in discrete or custom module packages and enables, among other things:
- Power Cycling with currents up to 2000 A for up to 32 devices under test – including millisecond-level cycles
- Bipolar Degradation Testing (pHTFB) up to 400 A with pulse durations as short as 100 ns
- Dynamic Gate Stress Testing with up to 48 devices under test at frequencies up to 500 kHz
Compact, scalable, and application-oriented – the ART is the ideal solution for research, development, and quality assurance in a rapidly evolving industry.